US 10,890,623 B1
Power saving scannable latch output driver
William Huott, Holmes, NY (US); Yuen Chan, Poughkeepsie, NY (US); Pradip Patel, Poughkeepsie, NY (US); and Daniel Rodko, Poughkeepsie, NY (US)
Filed by International Business Machines Corporation, Armonk, NY (US)
Filed on Sep. 4, 2019, as Appl. No. 16/559,776.
Int. Cl. G01R 31/28 (2006.01); G01R 31/3185 (2006.01); H03K 19/00 (2006.01)
CPC G01R 31/318541 (2013.01) [G01R 31/31855 (2013.01); G01R 31/318572 (2013.01); G01R 31/318575 (2013.01); H03K 19/0016 (2013.01)] 20 Claims
OG exemplary drawing
1. A method comprising:
receiving, by a circuit comprising a scannable latch, a scan signal;
based on the scan signal being enabled, turning on a scan output driver of the scannable latch, wherein a scan input of the scannable latch propagates through the scannable latch to a scan output based on the scan output driver being turned on; and
based on the scan signal being disabled, turning off the scan output driver, wherein the scan output driver comprises a first p-type field effect transistor (PFET) and a first n-type field effect transistor (NFET), wherein a gate of the first PFET and a gate of the first NFET are connected to an output of a latch of the scannable latch.