US 10,888,299 B2
Method and apparatus for x-ray imaging and gain calibration of detector and detector bracket
Peijun Chen, Beijing (CN); Wei Zhao, Beijing (CN); Yongtao Tan, Beijing (CN); and Rowland Saunders, Hartland, WI (US)
Assigned to GENERAL ELECTRIC COMPANY, Schenectady, NY (US)
Filed by GENERAL ELECTRIC COMPANY, Schenectady, NY (US)
Filed on Nov. 23, 2016, as Appl. No. 15/360,622.
Claims priority of application No. 2015 1 1016179 (CN), filed on Dec. 29, 2015.
Prior Publication US 2017/0181724 A1, Jun. 29, 2017
Int. Cl. A61B 6/00 (2006.01); H04N 5/52 (2006.01); A61B 5/00 (2006.01); H04N 5/367 (2011.01); H01L 27/146 (2006.01)
CPC A61B 6/585 (2013.01) [A61B 5/7225 (2013.01); H04N 5/52 (2013.01); A61B 5/72 (2013.01); A61B 6/58 (2013.01); H01L 27/14658 (2013.01); H04N 5/367 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A method for calibrating an X-ray detector, said method for calibrating an X-ray detector comprising:
retrieving a calibration parameter stored in the X-ray detector relative to said X-ray detector, wherein the retrieving of the calibration parameter stored in the X-ray detector relative to said X-ray detector comprises retrieving a first gain calibration parameter stored in said X-ray detector relative to said X-ray detector;
prior to calibrating said X-ray detector, retrieving a pre-stored second gain calibration parameter relative to a detection device bracket that holds said X-ray detector and performing data fusion on said second gain calibration parameter and said first gain calibration parameter to obtain a first total gain calibration parameter; and
calibrating said X-ray detector according to said first total gain calibration parameter.