US D1,057,170 S
Eye testing apparatus and equipment
Hiroyuki Okada, Tokyo (JP); Takeo Aoki, Tokyo (JP); and Yasuhisa Kaneda, Tokyo (JP)
Assigned to TOPCON CORPORATION, Tokyo (JP)
Filed by TOPCON CORPORATION, Tokyo (JP)
Filed on Feb. 17, 2022, as Appl. No. 29/827,120.
Term of patent 15 Years
LOC (15) Cl. 24 - 02
U.S. Cl. D24—172
OG exemplary drawing
 
The ornamental design for an eye testing apparatus and equipment as shown and described.