US 12,191,863 B2
Apparatuses and methods for duty cycle adjustment
Yantao Ma, Boise, ID (US)
Filed by MICRON TECHNOLOGY, INC., Boise, ID (US)
Filed on Apr. 18, 2018, as Appl. No. 15/956,601.
Application 15/956,601 is a continuation of application No. 13/670,222, filed on Nov. 6, 2012, granted, now 9,954,517.
Prior Publication US 2018/0241383 A1, Aug. 23, 2018
Int. Cl. H03K 5/156 (2006.01)
CPC H03K 5/1565 (2013.01) 17 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a dynamic random access memory (DRAM) including:
a duty cycle adjustment circuit configured to receive a signal, wherein, during a coarse adjustment selection operation, the duty cycle adjustment circuit is configured to select a coarse adjustment value to adjust a duty cycle of the signal by a coarse adjustment amount, wherein, after selection of the course adjustment value and during a fine adjustment selection operation, the duty cycle adjustment circuit is further configured to select a fine adjustment value to additionally adjust the duty cycle of the signal a fine adjustment amount to provide a duty cycle adjusted signal, wherein the duty cycle adjustment circuit comprises a first plurality of serially-coupled adjustor cells each configured to apply at least a portion of the fine adjustment amount and at least a portion of the coarse adjustment amount to the signal based on the fine adjustment value and the coarse adjustment value, respectively, wherein the duty cycle adjustment circuit further comprises a second plurality of serially-coupled adjustor cells each configured to selectively apply only a portion of the coarse adjustment amount to the signal based on the coarse adjustment value, wherein a first one of the first plurality of serially-coupled adjustor cells is configured to receive the signal simultaneous with receipt of the signal at a first one of the second of serially-coupled adjustor cells, wherein an adjustor cell of the first plurality of serially-coupled adjuster cells comprises a first transistor having a first size for providing a coarse adjustment and a second transistor having a second size for providing a fine adjustment, wherein the first size and the second size are different,
wherein the duty cycle adjustment circuit is enabled by a control signal provided by a memory controller in communication with the DRAM.