CPC H02M 3/07 (2013.01) [G11C 5/147 (2013.01); G11C 16/08 (2013.01); G11C 16/14 (2013.01); G11C 16/30 (2013.01)] | 20 Claims |
1. A semiconductor device comprising:
a plurality of memory cells; and
a peripheral circuit configured to control the plurality of memory cells,
wherein the peripheral circuit includes:
a temperature compensation circuit configured to output a compensation current determined based on a temperature of the semiconductor device,
a voltage regulator configured to regulate a pump voltage having a level determined based on the compensation current,
a clock generator configured to generate a clock signal having a frequency determined based on the compensation current, and
a charge pump circuit including:
a level shifter configured to output a control signal adjusted a swing level of the control signal based on the clock signal and the pump voltage, and
a plurality of unit circuits each including a plurality of pumping capacitors configured to be charged and discharged by the control signal.
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