US 12,190,575 B2
Reducing scale estimate errors in shelf images
Antonio Hurtado García, Valladolid (ES); Francisco Javier Martin, Valladolid (ES); and Diego García Morate, Valladolid (ES)
Assigned to Nielsen Consumer LLC, Chicago, IL (US)
Filed by Nielsen Consumer LLC, Chicago, IL (US)
Filed on Apr. 11, 2023, as Appl. No. 18/298,518.
Application 18/298,518 is a continuation of application No. 17/201,909, filed on Mar. 15, 2021, granted, now 11,640,707.
Application 17/201,909 is a continuation of application No. 16/401,744, filed on May 2, 2019, granted, now 10,949,665, issued on Mar. 16, 2021.
Application 16/401,744 is a continuation of application No. 15/317,674, granted, now 10,282,607, issued on May 7, 2019, previously published as PCT/IB2016/001664, filed on Oct. 28, 2016.
Prior Publication US 2023/0245443 A1, Aug. 3, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G06V 20/10 (2022.01); G06F 16/583 (2019.01); G06Q 10/087 (2023.01); G06T 11/60 (2006.01); G06V 10/25 (2022.01); G06V 10/75 (2022.01); G06V 20/00 (2022.01); G06V 20/68 (2022.01)
CPC G06V 20/10 (2022.01) [G06F 16/583 (2019.01); G06T 11/60 (2013.01); G06V 10/25 (2022.01); G06V 10/754 (2022.01); G06V 20/00 (2022.01); G06F 2218/12 (2023.01); G06Q 10/087 (2013.01); G06T 2207/30128 (2013.01); G06V 20/68 (2022.01); G06V 2201/06 (2022.01); G06V 2201/09 (2022.01)] 20 Claims
OG exemplary drawing
 
9. An apparatus comprising
memory;
instructions; and
processor circuitry to execute the instructions to:
determine a first scale estimate for a first shelf image;
analyze the first shelf image a first time using an image recognition application to identify matches between stored patterns and objects in the first shelf image based on the first scale estimate;
determine a scale correction value for the first shelf image based on the analysis of the first shelf image the first time;
determine a second scale estimate for the first shelf image based on the first scale estimate and the scale correction value; and
analyze the first shelf image a second time to identify matches between the stored patterns and the objects in the first shelf image based on the second scale estimate.