US 12,190,519 B2
Inspection device, inspection method and storage medium
Tomoharu Kiyuna, Tokyo (JP); Ikuma Takahashi, Tokyo (JP); Maki Sano, Tokyo (JP); Kenichi Kamijo, Tokyo (JP); Kimiyasu Takoh, Tokyo (JP); and Yoshikazu Kitamura, Tokyo (JP)
Assigned to NEC CORPORATION, Tokyo (JP)
Appl. No. 17/436,690
Filed by NEC Corporation, Tokyo (JP)
PCT Filed Jan. 24, 2020, PCT No. PCT/JP2020/002497
§ 371(c)(1), (2) Date Sep. 7, 2021,
PCT Pub. No. WO2020/183936, PCT Pub. Date Sep. 17, 2020.
Claims priority of application No. 2019-045192 (JP), filed on Mar. 12, 2019.
Prior Publication US 2022/0148182 A1, May 12, 2022
Int. Cl. G06T 7/73 (2017.01); A61B 1/04 (2006.01); G06T 7/00 (2017.01)
CPC G06T 7/0016 (2013.01) [A61B 1/04 (2013.01); G06T 7/73 (2017.01); G06T 2207/10068 (2013.01); G06T 2207/20084 (2013.01)] 11 Claims
OG exemplary drawing
 
1. An inspection device comprising a processor configured to:
acquire, as target images which indicate a target object of inspection, images photographed in time series by a photographing unit which is inserted into a lumen that is the target object in endoscopy; and
detect, on a basis of a group of the images that each indicate the target object in a normal state, the target image that indicates the target object that is not in the normal state among the acquired target images.