US 12,189,974 B2
Operational monitoring for memory devices
Aaron P. Boehm, Boise, ID (US); Todd J. Plum, Boise, ID (US); Scott D. Van De Graaff, Boise, ID (US); Scott E. Schaefer, Boise, ID (US); and Mark D. Ingram, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Jun. 11, 2021, as Appl. No. 17/345,267.
Claims priority of provisional application 63/040,337, filed on Jun. 17, 2020.
Prior Publication US 2021/0397363 A1, Dec. 23, 2021
Int. Cl. G06F 3/06 (2006.01); G06F 1/06 (2006.01)
CPC G06F 3/0653 (2013.01) [G06F 1/06 (2013.01); G06F 3/0625 (2013.01); G06F 3/0655 (2013.01); G06F 3/0679 (2013.01)] 22 Claims
OG exemplary drawing
 
1. A method, comprising:
initializing operation of a memory device;
determining, by circuitry of the memory device and based at least in part on the initializing operation of the memory device, a cumulative duration, since the initializing operation of the memory device, for which an access rate of the memory device satisfies an access rate threshold;
storing, in a non-volatile storage component of the memory device, an indication of the cumulative duration for which the access rate of the memory device satisfies the access rate threshold; and
signaling, by the memory device to a host device coupled with the memory device and based at least in part on the cumulative duration satisfying a duration threshold, a status of the memory device, wherein the status of the memory device is based at least in part on the stored indication of the cumulative duration for which the access rate of the memory device satisfies the access rate threshold.