US 12,189,955 B2
Skip program verify for dynamic start voltage sampling
Archana Tankasala, Sunnyvale, CA (US); Sagar Upadhyay, Folsom, CA (US); Shantanu R. Rajwade, San Mateo, CA (US); and Aliasgar S. Madraswala, Folsom, CA (US)
Assigned to Intel NDTM US LLC, Santa Clara, CA (US)
Filed by Intel NDTM US LLC, Santa Clara, CA (US)
Filed on Dec. 28, 2022, as Appl. No. 18/089,969.
Prior Publication US 2023/0161478 A1, May 25, 2023
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0611 (2013.01) [G06F 3/064 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A memory device comprising:
a controller to program a multi-level cell (MLC) memory, including to:
sample a portion of the MLC memory using a series of program pulses with increasing magnitude of voltage;
follow each program pulse with a series of program verifies to compare a voltage level of cells in the portion of the MLC memory against corresponding program verify threshold voltage levels until a minimum program pulse voltage to start to program the MLC memory is reached; and
skip all but one or more lower level program verifies in the series of program verifies to reduce a time until the minimum program pulse voltage is reached.