US 12,188,977 B2
Contact probe, probe holder and probe unit
Tsuyoshi Inuma, Kanagawa (JP); Shuji Takahashi, Kanagawa (JP); Kazuya Soma, Kanagawa (JP); Takashi Nidaira, Kanagawa (JP); and Yuya Hironaka, Kanagawa (JP)
Assigned to NHK Spring Co., Ltd., Yokohama (JP)
Appl. No. 17/911,827
Filed by NHK Spring Co., Ltd., Yokohama (JP)
PCT Filed Mar. 17, 2021, PCT No. PCT/JP2021/010922
§ 371(c)(1), (2) Date Sep. 16, 2022,
PCT Pub. No. WO2021/193304, PCT Pub. Date Sep. 30, 2021.
Claims priority of application No. 2020-053388 (JP), filed on Mar. 24, 2020.
Prior Publication US 2023/0138105 A1, May 4, 2023
Int. Cl. G01R 1/073 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/2863 (2013.01) [G01R 1/07314 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A probe unit comprising:
a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction;
a second contact probe connected to an external ground; and
a probe holder configured to hold the first and second contact probes, the probe holder including
a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes,
a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and
a through-hole provided around the first hollow portion, wherein
the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.