US 12,188,961 B2
Method for accurate pad contact testing
Kushagra Sinha, Wappingers Falls, NY (US); Zheng Xu, Wappingers Falls, NY (US); Yufei Wu, Poughkeepsie, NY (US); Myra Ahmad, San Jose, CA (US); and Nikhilesh C Sahani, Wappingers Falls, NY (US)
Assigned to International Business Machines Corporation, Armonk, NY (US)
Filed by INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US)
Filed on Jul. 29, 2022, as Appl. No. 17/876,652.
Prior Publication US 2024/0036074 A1, Feb. 1, 2024
Int. Cl. G01R 1/067 (2006.01); G01R 31/28 (2006.01)
CPC G01R 1/06794 (2013.01) [G01R 31/2891 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A testing apparatus, comprising:
a plurality of probe pairs arranged in an array to correspond to an array of terminal pads of a sample, each of the probe pairs including a main probe pin and a secondary probe pin separated from the main probe pin by an insulator;
a plurality of contact indicators; wherein each one of the contact indicators of the plurality of contact indicator electrically connected in series with the main probe pin and the secondary probe pin for each of the plurality of probe pairs;
a global indicator circuit electrically connected to the plurality of probe pairs, wherein the global indicator circuit includes
a logical AND gate electrically connected to the plurality of probe pairs and configured to receive input from each of the contact indictors, and
a global indicator electrically connected in series to the logical AND gate and configured to receive an output of the logical AND gate, and configured to emit at least one of an audible or visual indication when both of the main probe pin and secondary probe pin for all of the plurality of probe pairs are in physical and electrical engagement with their respective terminal pads of the sample to complete the global electrical circuit.