US 12,188,896 B2
Adaptive programmable modulation techniques for miniaturized measurement devices
Sudhakar Pamarti, Irvine, CA (US); Shyamsunder Erramilli, Quincy, MA (US); and Pritiraj Mohanty, Beverly Hills, CA (US)
Assigned to FemtoDx, Inc., Beverly Hills, CA (US)
Appl. No. 17/776,754
Filed by FemtoDx, Inc., Beverly Hills, CA (US)
PCT Filed Jan. 27, 2020, PCT No. PCT/US2020/015151
§ 371(c)(1), (2) Date May 13, 2022,
PCT Pub. No. WO2021/096546, PCT Pub. Date May 20, 2021.
Claims priority of provisional application 62/934,971, filed on Nov. 13, 2019.
Prior Publication US 2022/0397548 A1, Dec. 15, 2022
Int. Cl. G01N 27/41 (2006.01); G01N 27/04 (2006.01); G01N 27/414 (2006.01)
CPC G01N 27/4148 (2013.01) [G01N 27/04 (2013.01); G01N 27/4146 (2013.01); G01N 27/4145 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A method of programming a measurement device, comprising:
demodulating a first received signal from a device-under-test (DUT) using a first delayed version of an oscillator signal;
generating a second delayed version of the oscillator signal based on demodulating the first received signal; and
demodulating a second received signal from the DUT using the second delayed version of the oscillator signal,
wherein:
the DUT includes at least one semiconductor nanowire;
demodulating the first received signal includes mixing the first received signal with the first delayed version of the oscillator signal to generate a first baseband signal; and
generating the second delayed version of the oscillator signal includes determining a second delay based on the first baseband signal.