US 12,188,887 B2
Material property testing system and method
Oliver Smith, Chesterland, OH (US)
Assigned to Innogized Technologies, Inc., Cleveland, OH (US)
Appl. No. 17/289,348
Filed by Innogized Technologies, Inc., Cleveland, OH (US)
PCT Filed Oct. 31, 2019, PCT No. PCT/US2019/059074
§ 371(c)(1), (2) Date Apr. 28, 2021,
PCT Pub. No. WO2020/092713, PCT Pub. Date May 7, 2020.
Claims priority of provisional application 62/861,341, filed on Jun. 14, 2019.
Claims priority of provisional application 62/754,671, filed on Nov. 2, 2018.
Prior Publication US 2021/0396694 A1, Dec. 23, 2021
Int. Cl. G01N 25/18 (2006.01); G01B 7/06 (2006.01); G01N 3/307 (2006.01); G01N 3/42 (2006.01); G01N 21/00 (2006.01); G01N 29/04 (2006.01); G01N 21/31 (2006.01)
CPC G01N 25/18 (2013.01) [G01B 7/06 (2013.01); G01N 21/00 (2013.01); G01N 29/04 (2013.01); G01N 3/307 (2013.01); G01N 3/42 (2013.01); G01N 21/31 (2013.01); G01N 2291/02827 (2013.01); G01N 2291/02854 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A measurement device, comprising:
a portable housing, comprising:
a first member configured to contact a material sample;
a measurement system comprising a source element including an electromagnetic radiation source, a speaker, or a vibrator in the first member and a sensor element including a photodiode, a camera, a microphone, or an accelerometer;
measurement circuitry configured to control the source element and the sensor element to generate data for the material sample, wherein the measurement circuitry is configured to measure a thickness of the material sample such that the data corresponds to the measured thickness; and
analysis circuitry configured to:
determine a property of the material sample based on the data; and
determine information related to the property; and
an indicia circuitry configured to communicate the information to a user of the measurement device.