US 12,188,765 B2
Adjustable update rate for measuring probe
Scott Allen Harsila, Shoreline, WA (US); Bjorn Erik Bertil Jansson, Snohomish, WA (US); and Hiroyuki Kanamori, Kawasaki (JP)
Assigned to Mitutoyo Corporation, Kanagawa-ken (JP)
Filed by Mitutoyo Corporation, Kanagawa-ken (JP)
Filed on Sep. 7, 2022, as Appl. No. 17/939,710.
Prior Publication US 2024/0077296 A1, Mar. 7, 2024
Int. Cl. G01B 5/008 (2006.01); G01B 5/016 (2006.01)
CPC G01B 5/016 (2013.01) 20 Claims
OG exemplary drawing
 
1. A measuring system, comprising:
a measuring probe comprising:
a stylus having a contact portion to be in contact with a workpiece to be measured;
at least one detection element capable of detecting a movement of the contact portion as corresponding to a contact with a workpiece; and
a signal processing portion configured to process a generated signal obtained from an output of the at least one detection element to output a measurement signal;
wherein the measuring probe is configured to:
operate with a first update rate during at least part of a moving mode, wherein the moving mode comprises at least one of a movement of the measuring probe such that the contact portion is moved away from the workpiece or a movement of the measuring probe such that the contact portion is moved at a distance from the workpiece that is equal to or greater than a threshold distance; and
operate with a second update rate during at least part of a measuring mode, wherein the measuring mode comprises a movement of the measuring probe such that the contact portion is moved toward the workpiece for obtaining a measurement, and the second update rate is faster than the first update rate.