CPC C07D 401/06 (2013.01) [C07B 2200/13 (2013.01)] | 39 Claims |
1. A free base crystalline form of Compound A, selected from the following forms:
(i) a free base anhydrous crystalline Form I of Compound A, characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 9.78, 12.45, 15.70, 16.46, and 16.94±0.2° 2θ using Cu Kα radiation;
(ii) a free base anhydrous crystalline Form II of Compound A, characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 7.67, 11.54, 18.27, and 23.28±0.2° 2θ using Cu Kα radiation; and
(iii) a free base monohydrate crystalline Form III of Compound A, characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 7.31, 10.77, and 13.96±0.2° 2θ using Cu Kα radiation,
wherein Compound A is:
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8. A free base anhydrous crystalline form of Compound A (“Form IV”), characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 8.06, 11.29, and 14.97±0.2° 2θ using Cu Kα radiation,
wherein Compound A is:
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16. A crystalline form of Compound A hydrochloride salt, characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 8.45, 16.93, 23.74, 24.59, and 26.57±0.2° 2θ using Cu Kα radiation,
wherein Compound A is:
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18. A crystalline form of Compound A and dichloromethane, characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 11.46, 16.91, 23.10, and 24.58±0.2° 2θ using Cu Kα radiation,
wherein Compound A is:
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20. A crystalline form of Compound A and nitromethane, characterized by an X-ray powder diffraction (XRPD) pattern comprising peaks at 8.94, 15.86, 17.12, 19.51, 19.83, and 24.41±0.2° 2θ using Cu Kα radiation,
wherein Compound A is:
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