US 11,852,597 B2
Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
Hideo Toraya, Akishima (JP)
Assigned to RIGAKU CORPORATION, Tokyo (JP)
Filed by Rigaku Corporation, Akishima (JP)
Filed on Jun. 6, 2022, as Appl. No. 17/832,789.
Claims priority of application No. 2021-095294 (JP), filed on Jun. 7, 2021.
Prior Publication US 2022/0390392 A1, Dec. 8, 2022
Int. Cl. G01N 23/20 (2018.01)
CPC G01N 23/20 (2013.01) [G01N 2223/0566 (2013.01); G01N 2223/60 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A degree-of-crystallinity measurement apparatus, comprising:
a measured pattern acquisition unit configured to acquire a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance,
a known pattern acquisition unit configured to acquire a known X-ray scattering pattern of the other known mixed substance,
a crystalline pattern acquisition unit configured to at least partially acquire, based on the measured X-ray scattering pattern of the sample, an X-ray diffraction pattern of a crystalline portion included in the target substance,
a crystalline integrated intensity calculation unit configured to calculate an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion,
a target substance integrated intensity calculation unit configured to calculate an integrated intensity for an X-ray scattering pattern of the target substance based on the measured X-ray scattering pattern of the sample and the known X-ray scattering pattern; and
a degree-of-crystallinity calculation unit configured to calculate a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target substance.