CPC G01N 23/20 (2013.01) [G01N 2223/0566 (2013.01); G01N 2223/60 (2013.01)] | 8 Claims |
1. A degree-of-crystallinity measurement apparatus, comprising:
a measured pattern acquisition unit configured to acquire a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance,
a known pattern acquisition unit configured to acquire a known X-ray scattering pattern of the other known mixed substance,
a crystalline pattern acquisition unit configured to at least partially acquire, based on the measured X-ray scattering pattern of the sample, an X-ray diffraction pattern of a crystalline portion included in the target substance,
a crystalline integrated intensity calculation unit configured to calculate an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion,
a target substance integrated intensity calculation unit configured to calculate an integrated intensity for an X-ray scattering pattern of the target substance based on the measured X-ray scattering pattern of the sample and the known X-ray scattering pattern; and
a degree-of-crystallinity calculation unit configured to calculate a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target substance.
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