US 11,838,679 B2
Infrared imaging device
Tomohiro Maegawa, Tokyo (JP); and Hiroshi Hirosaki, Tokyo (JP)
Assigned to Mitsubishi Electric Corporation, Tokyo (JP)
Appl. No. 17/434,358
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
PCT Filed Jun. 12, 2019, PCT No. PCT/JP2019/023194
§ 371(c)(1), (2) Date Aug. 26, 2021,
PCT Pub. No. WO2020/250327, PCT Pub. Date Dec. 17, 2020.
Prior Publication US 2022/0159199 A1, May 19, 2022
Int. Cl. H04N 5/33 (2023.01); G01J 5/0804 (2022.01); G01K 1/14 (2021.01); G01J 5/00 (2022.01)
CPC H04N 5/33 (2013.01) [G01J 5/0804 (2022.01); G01K 1/14 (2013.01); G01J 2005/0077 (2013.01)] 19 Claims
OG exemplary drawing
 
1. An infrared imaging device, comprising:
an infrared imaging sensor in which a plurality of pixels for detecting incident infrared light as heat are arrayed;
a substrate temperature sensor to measure a temperature of a substrate on which the infrared imaging sensor is mounted;
a temperature drift compensation amount calculator to calculate a temperature drift compensation amount in accordance with a temperature change of the substrate, with respect to a pixel output outputted from each of the plurality of pixels;
a function generator to generate a function for calculating the temperature drift compensation amount with the temperature of the substrate as an independent variable; and
a timing controller to cause the infrared imaging sensor and the substrate temperature sensor to synchronously output data to the function generator during a period in which the temperature of the substrate changes along with a start of energization to the substrate, as data for generation to generate the function, wherein
the function generator uses the data for generation output after the generation of the function as additional data for improving accuracy of the function.