US 11,835,410 B2
Determination of resonant frequency and quality factor for a sensor system
Michael A. Kost, Cedar Park, TX (US); Tejasvi Das, Austin, TX (US); Marc J. Kobayashi, Austin, TX (US); Siddharth Maru, Austin, TX (US); and Rahul Gawde, Lakeway, TX (US)
Assigned to Cirrus Logic Inc., Austin, TX (US)
Filed by Cirrus Logic International Semiconductor Ltd., Edinburgh (GB)
Filed on Oct. 26, 2020, as Appl. No. 17/079,709.
Claims priority of provisional application 63/044,065, filed on Jun. 25, 2020.
Prior Publication US 2021/0404901 A1, Dec. 30, 2021
Int. Cl. G01L 27/00 (2006.01); G01L 1/16 (2006.01); G06F 3/041 (2006.01); G01L 1/14 (2006.01); G01L 1/22 (2006.01)
CPC G01L 27/00 (2013.01) [G01L 1/142 (2013.01); G01L 1/16 (2013.01); G01L 1/22 (2013.01); G06F 3/0414 (2013.01)] 42 Claims
OG exemplary drawing
 
1. A method for determining sensor parameters of an actively-driven sensor system, comprising:
performing an initialization operation to establish a baseline estimate of the sensor parameters;
obtaining as few as three samples of a measured physical quantity versus frequency for the actively-driven sensor system;
performing a refinement operation to provide a refined version of the sensor parameters based on the as few as three samples;
iteratively repeating the refinement operation until the difference between successive refined versions of the sensor parameters is below a defined threshold; and
outputting the refined sensor parameters as updated sensor parameters for the actively-driven sensor system.