US 11,817,883 B2
Variable length ECC code according to value length in NVMe key value pair devices
David Avraham, Even Yehuda (IL); Ran Zamir, Ramat Gan (IL); and Alexander Bazarsky, Holon (IL)
Assigned to Western Digital Technologies, Inc., San Jose, CA (US)
Filed by Western Digital Technologies, Inc., San Jose, CA (US)
Filed on Dec. 27, 2021, as Appl. No. 17/562,105.
Prior Publication US 2023/0208448 A1, Jun. 29, 2023
Int. Cl. H03M 13/00 (2006.01); G06F 11/10 (2006.01)
CPC H03M 13/6577 (2013.01) [G06F 11/1068 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A data storage device, comprising:
a memory device; and
a controller coupled to the memory device, the controller configured to:
determine an error correction code (ECC) code length for key value (KV) pair data and/or an ECC code rate for the KV pair data, wherein the ECC code length and the ECC code rate are selected according to a value length of the KV pair data and a correction capability associated with the KV pair data, and wherein the correction capability is based on a detected pattern of the KV pair data;
generate ECC parity based on the selecting; and
program the KV pair data and the generated ECC parity to the memory device.