CPC H02H 9/04 (2013.01) [G06F 1/28 (2013.01)] | 25 Claims |
1. A method comprising:
monitoring a voltage state for a processor in a semiconductor device;
detecting, at a first time, the processor is in a high voltage state;
determining a protective current for the processor to lower the voltage state of the processor from the high voltage state;
activating at least one current generator to implement the protective current;
detecting, at a second time, the processor is in a second voltage state; and
adjusting an activation of the at least one current generator based on the second voltage state.
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