US 11,808,938 B2
Apparatus for measuring optical characteristics of a test optical element under low-temperature environment
Wei-Ting Chiu, Hsinchu Science Park (TW); Chu-Tsung Chan, Hsinchu Science Park (TW); Sandeep Kumar Paral, Hsinchu Science Park (TW); and Chia-Chang Lee, Hsinchu Science Park (TW)
Assigned to YOUNG OPTICS INC., Hsinchu Science Park (TW)
Filed by YOUNG OPTICS INC., Hsinchu Science Park (TW)
Filed on May 28, 2021, as Appl. No. 17/334,023.
Claims priority of application No. 109118932 (TW), filed on Jun. 5, 2020.
Prior Publication US 2021/0382301 A1, Dec. 9, 2021
Int. Cl. G02B 27/00 (2006.01); G01J 1/02 (2006.01); G02B 7/02 (2021.01); G01M 11/02 (2006.01)
CPC G02B 27/0006 (2013.01) [G01J 1/0252 (2013.01); G01M 11/02 (2013.01); G01M 11/0207 (2013.01); G01M 11/0264 (2013.01); G02B 7/028 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An optical measurement apparatus, comprising:
a thermal insulation housing provided with a first opening and a second opening respectively communicating with spaces outside opposite sides of the thermal insulation housing;
a first light-transmissive plate disposed at the first opening;
a second light-transmissive plate disposed at the second opening, wherein the thermal insulation housing, the first light-transmissive plate and the second light-transmissive plate define a chamber;
a heat-conductive layer disposed in the chamber;
a cooling source coupled to the heat-conductive layer; and
a photosensor disposed outside the chamber and on one side of the second light-transmissive plate facing away from the first light-transmissive plate.