US 11,808,714 B2
Inspection device, blister packaging machine, and blister sheet manufacturing method
Yukihiro Taguchi, Aichi (JP)
Assigned to CKD CORPORATION, Aichi (JP)
Filed by CKD CORPORATION, Aichi (JP)
Filed on Mar. 15, 2021, as Appl. No. 17/201,611.
Application 17/201,611 is a continuation of application No. PCT/JP2019/030669, filed on Aug. 5, 2019.
Claims priority of application No. 2018-191570 (JP), filed on Oct. 10, 2018.
Prior Publication US 2021/0199594 A1, Jul. 1, 2021
Int. Cl. G01N 21/90 (2006.01); B65B 1/02 (2006.01); B65B 1/04 (2006.01); B65B 47/04 (2006.01); B65B 57/02 (2006.01); G01N 21/88 (2006.01)
CPC G01N 21/9027 (2013.01) [B65B 1/02 (2013.01); B65B 1/04 (2013.01); B65B 47/04 (2013.01); B65B 57/02 (2013.01); G01N 21/8806 (2013.01); G01N 2201/061 (2013.01)] 6 Claims
OG exemplary drawing
 
1. An inspection device comprising:
an illumination device that irradiates an object with near-infrared light;
a spectroscope that disperses reflected light from the object irradiated with the near-infrared light;
an imaging device that takes a spectroscopic image of the reflected light dispersed by the spectroscope; and
a processor that:
obtains spectral data at a plurality of points on the object based on the spectroscopic image obtained by the imaging device,
selects, from among the spectral data at the plurality of points, a group having a highest density of luminance values of a predetermined wavelength component as a dense spectral data group, and
performs a predetermined analysis for the object based on the dense spectral data group and detects a different type of object.