US 11,806,867 B2
Profiling apparatus
Shinichi Iida, Sakai (JP); Shigeaki Tochimoto, Ibaraki (JP); and Hiroshi Takaoka, Yao (JP)
Assigned to KONICA MINOLTA, INC., Tokyo (JP)
Appl. No. 16/968,497
Filed by KONICA MINOLTA, INC., Chiyoda-ku (JP)
PCT Filed Jan. 18, 2019, PCT No. PCT/JP2019/001368
§ 371(c)(1), (2) Date Aug. 7, 2020,
PCT Pub. No. WO2019/155845, PCT Pub. Date Aug. 15, 2019.
Claims priority of application No. 2018-021585 (JP), filed on Feb. 9, 2018.
Prior Publication US 2020/0406484 A1, Dec. 31, 2020
Int. Cl. G01B 5/20 (2006.01); B25J 19/02 (2006.01); B25J 9/16 (2006.01)
CPC B25J 19/021 (2013.01) [B25J 9/1697 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A profiling apparatus that causes a subject surface of a subject to follow a target surface of a target, the profiling apparatus comprising:
a holding part that rotationally moves around a first fulcrum, and holds the subject;
an intermediate part that is coupled to the holding part at one end, and has a degree of freedom except a coupling direction; and
a balancer part that is coupled to another end of the intermediate part, and rotationally moves around a second fulcrum different from the first fulcrum,
wherein a first fulcrum position of the first fulcrum,
a first gravity center position,
a bending position, and
a second gravity center position are aligned in this order,
the first gravity center position corresponding to a gravity center of a part, which rotationally moves around the first fulcrum, of the subject and the holding part in a case where the subject is held,
the bending position corresponding to a bending point of the intermediate part,
the second gravity center position corresponding to a gravity center of a part, which rotationally moves around the second fulcrum, of the second fulcrum position and the balancer part.