US 11,792,052 B2
Semiconductor apparatus including calibration circuit
Jung Hyun Shin, Icheon-si (KR); and Yongsuk Choi, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Jan. 26, 2022, as Appl. No. 17/585,308.
Claims priority of application No. 10-2021-0113997 (KR), filed on Aug. 27, 2021.
Prior Publication US 2023/0068894 A1, Mar. 2, 2023
Int. Cl. H04L 25/02 (2006.01); H01L 23/64 (2006.01)
CPC H04L 25/0278 (2013.01) [H01L 23/64 (2013.01)] 21 Claims
OG exemplary drawing
 
1. A semiconductor apparatus comprising:
a first reference resistor and a second reference resistor having different resistance values from each other;
a calibration circuit configured to generate a first calibration signal by being coupled to the first reference resistor and performing a calibration operation, and generate a second calibration signal by being coupled to the second reference resistor and performing a calibration operation;
a selection circuit configured to generate an impedance control signal by selecting one of the first and second calibration signals based on an impedance setting signal; and
a data circuit configured to set an impedance based on the impedance control signal.