CPC H04L 25/0278 (2013.01) [H01L 23/64 (2013.01)] | 21 Claims |
1. A semiconductor apparatus comprising:
a first reference resistor and a second reference resistor having different resistance values from each other;
a calibration circuit configured to generate a first calibration signal by being coupled to the first reference resistor and performing a calibration operation, and generate a second calibration signal by being coupled to the second reference resistor and performing a calibration operation;
a selection circuit configured to generate an impedance control signal by selecting one of the first and second calibration signals based on an impedance setting signal; and
a data circuit configured to set an impedance based on the impedance control signal.
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