US 11,791,910 B2
System and method for electronic device fault diagnoses
Philip J. Jakes, Durham, NC (US); and James C. Salembier, Cary, NC (US)
Assigned to Lenovo (Singapore) Pte. Ltd., New Tech Park (SG)
Filed by Lenovo (Singapore) Pte. Ltd., New Tech Park (SG)
Filed on Jun. 23, 2021, as Appl. No. 17/355,304.
Prior Publication US 2022/0416913 A1, Dec. 29, 2022
Int. Cl. H04B 17/15 (2015.01); H04B 17/29 (2015.01); G08B 5/22 (2006.01); G01R 29/08 (2006.01); H04B 17/318 (2015.01); H04B 17/23 (2015.01)
CPC H04B 17/15 (2015.01) [G01R 29/0871 (2013.01); G01R 29/0892 (2013.01); G08B 5/22 (2013.01); H04B 17/23 (2015.01); H04B 17/29 (2015.01); H04B 17/318 (2015.01)] 18 Claims
OG exemplary drawing
 
1. An electronic device comprising:
a substrate for receiving communication circuitry;
an antenna coupled to the substrate and configured to provide a first signal to the communication circuitry;
one or more processors;
a data storage device having executable instructions accessible by the one or more processors;
wherein, responsive to execution of the instructions, the one or more processors are configured to:
monitor the antenna or the communication circuitry to detect the first signal;
receive a second signal at the communication circuitry; and
prompt a communication related to the antenna in response to not detecting the first signal when receiving the second signal or detecting a first degraded signal compared to the second signal;
wherein the first signal is the first degraded signal when the first signal has a strength that is less than a threshold percentage of the second signal; and
wherein the threshold percentage varies based on the location of the electronic device or duration of time of monitoring the first signal.