US 11,791,908 B2
Systems and methods for testing multiple mmWave antennas
Sze Yang Dennis Ng, Sunnyvale, CA (US); Jr-Yi Shen, Saratoga, CA (US); and Harish Rajagopalan, San Jose, CA (US)
Assigned to APPLE INC., Cupertino, CA (US)
Filed by Apple Inc., Cupertino, CA (US)
Filed on Jun. 1, 2021, as Appl. No. 17/335,607.
Prior Publication US 2022/0385378 A1, Dec. 1, 2022
Int. Cl. H04B 17/10 (2015.01); H04B 7/0408 (2017.01); H01Q 15/14 (2006.01)
CPC H04B 17/101 (2015.01) [H01Q 15/14 (2013.01); H04B 7/0408 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A testing system, comprising:
a test electronic device comprising a test antenna configured to be disposed in a first signal path of a first antenna of an electronic device and receive a first signal from the first antenna;
a first reflector configured to be disposed in a second signal path of a second antenna of the electronic device and reflect a second signal from the second antenna to the test antenna; and
a second reflector configured to be disposed in a third signal path of a third antenna of the electronic device and reflect a third signal from the third antenna to the test antenna.