US 11,791,002 B2
Semiconductor memory device maintaining verification data during program suspend, and method of operating the semiconductor memory device
Yeong Jo Mun, Icheon-si (KR); and Dong Hun Kwak, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Aug. 5, 2022, as Appl. No. 17/882,295.
Claims priority of application No. 10-2022-0034320 (KR), filed on Mar. 18, 2022.
Prior Publication US 2023/0298679 A1, Sep. 21, 2023
Int. Cl. G11C 16/10 (2006.01); G11C 16/34 (2006.01)
CPC G11C 16/3459 (2013.01) [G11C 16/102 (2013.01); G11C 16/3404 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of operating a semiconductor memory device, the method comprising:
starting a program operation on selected memory cells using a main verification voltage and an auxiliary verification voltage in response to a program command;
receiving a program suspend command during the program operation; and
changing at least one auxiliary voltage verification result information among threshold voltage states which are not program-passed to at least one data pattern among threshold voltage states which program-passed, in response to the program suspend command.