US 11,790,512 B2
Defect inspection device
Kiyoung Song, Seoul (KR); and Hunmin Cho, Seoul (KR)
Assigned to SuaLab Co., Ltd., Seoul (KR)
Appl. No. 17/425,666
Filed by SuaLab Co., Ltd., Seoul (KR)
PCT Filed Jan. 3, 2020, PCT No. PCT/KR2020/000110
§ 371(c)(1), (2) Date Jul. 23, 2021,
PCT Pub. No. WO2020/153623, PCT Pub. Date Jul. 30, 2020.
Claims priority of application No. 10-2019-0009273 (KR), filed on Jan. 24, 2019.
Prior Publication US 2022/0092765 A1, Mar. 24, 2022
Int. Cl. G06T 7/00 (2017.01); G06V 10/40 (2022.01); G01N 21/88 (2006.01); G01N 21/89 (2006.01); H04N 7/18 (2006.01); H04N 23/56 (2023.01); H04N 23/80 (2023.01); H04N 23/90 (2023.01); G01N 33/00 (2006.01)
CPC G06T 7/0004 (2013.01) [G01N 21/8806 (2013.01); G01N 21/8901 (2013.01); G06V 10/40 (2022.01); H04N 7/181 (2013.01); H04N 23/56 (2023.01); H04N 23/80 (2023.01); H04N 23/90 (2023.01); G01N 2033/0078 (2013.01); G06T 2207/10152 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A defect inspection device comprising:
a robot arm including a hold unit for holding an object and a driving unit for moving the object;
a first camera unit photographing an exterior of the object;
an illumination unit irradiating light to the exterior of the object; and
a control unit determining whether there is a defect in the object based on an image of the object photographed by the first camera unit, wherein the control unit determines whether there is the object based on two or more images photographed under different illumination conditions, respectively, and
wherein the control unit
calculates a first normal image photographed under a first illumination condition and a second normal image photographed under a second illumination condition which are normal images which are a basis of anomaly determination by using both images as inputs of channels included in a first sub model included in a defect inspection model, respectively,
calculates a first determination object image photographed under the first illumination condition and a second determination object image photographed under the second illumination condition which are anomaly determination object images by using both images as inputs of channels included in a second sub model included in the defect inspection model, respectively, and
determines whether there is the defect in the object based on a calculation result of the first sub model and the second sub model.