CPC G06F 30/20 (2020.01) [G06F 30/39 (2020.01); G06F 2119/02 (2020.01); G06F 2119/04 (2020.01); G06F 2119/08 (2020.01)] | 20 Claims |
1. A method, comprising:
obtaining, by a processing device, device-level parameter degradation data for at least one process, voltage, temperature (PVT) condition associated with a multi-dimensional PVT space by extrapolating device-level stress data of a circuit comprising one or more devices to a target circuit age for the circuit;
obtaining, by the processing device, an aged circuit comprising the one or more devices by applying the device-level parameter degradation data to a set of device-level parameters; and
initiating, by the processing device, a process to perform a plurality of degradation simulations with respect to the aged circuit for a process corner associated with the at least one PVT condition, wherein each degradation simulation of the plurality of degradation simulations is performed for a respective set of sweep parameters of a plurality of sets of sweep parameters, and wherein each set of sweep parameters of the plurality of sets of sweep parameters corresponds to a respective dimension of the multi-dimensional PVT space.
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