CPC G01R 31/318544 (2013.01) [G01R 31/318335 (2013.01); G01R 31/318357 (2013.01); G01R 31/318569 (2013.01)] | 20 Claims |
1. A method of single-pass diagnosis in a circuit under test (CUT), the method comprising:
selecting, by a processor, a plurality of a scan chains in the CUT, wherein:
the plurality of scan chains comprises a first scan chain and a second scan chain,
the first scan chain comprises a plurality of first scan cells that are connected to form the first scan chain, and
the second scan chain comprises a plurality of second scan cells that are connected to form the second scan chain;
determining, by the processor, presence of at least: a first defect in the first scan chain, and a second defect in the second scan chain;
mapping, by the processor, the first defect to a first range of first scan cells, and the second defect to a second range of second scan cells;
locating, by the processor, based at least in part on a failing capture pattern set, the first defect in a first scan cell of the first range, and the second defect in a second scan cell of the second range; and
outputting, by the processor, a first location corresponding to the first scan cell and a second location corresponding to the second scan cell.
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