US 11,789,077 B2
Single-pass diagnosis for multiple chain defects
Emil Gizdarski, Cupertino, CA (US)
Assigned to Synopsys, Inc., Mountain View, CA (US)
Appl. No. 17/438,521
Filed by Synopsys, Inc., Mountain View, CA (US)
PCT Filed Mar. 13, 2020, PCT No. PCT/US2020/022758
§ 371(c)(1), (2) Date Sep. 13, 2021,
PCT Pub. No. WO2020/186214, PCT Pub. Date Sep. 17, 2020.
Claims priority of provisional application 62/817,596, filed on Mar. 13, 2019.
Prior Publication US 2022/0128628 A1, Apr. 28, 2022
Int. Cl. G01R 31/3185 (2006.01); G01R 31/3183 (2006.01)
CPC G01R 31/318544 (2013.01) [G01R 31/318335 (2013.01); G01R 31/318357 (2013.01); G01R 31/318569 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of single-pass diagnosis in a circuit under test (CUT), the method comprising:
selecting, by a processor, a plurality of a scan chains in the CUT, wherein:
the plurality of scan chains comprises a first scan chain and a second scan chain,
the first scan chain comprises a plurality of first scan cells that are connected to form the first scan chain, and
the second scan chain comprises a plurality of second scan cells that are connected to form the second scan chain;
determining, by the processor, presence of at least: a first defect in the first scan chain, and a second defect in the second scan chain;
mapping, by the processor, the first defect to a first range of first scan cells, and the second defect to a second range of second scan cells;
locating, by the processor, based at least in part on a failing capture pattern set, the first defect in a first scan cell of the first range, and the second defect in a second scan cell of the second range; and
outputting, by the processor, a first location corresponding to the first scan cell and a second location corresponding to the second scan cell.