CPC G01B 11/2527 (2013.01) [G06T 7/521 (2017.01); G06T 2207/30108 (2013.01)] | 21 Claims |
1. A method for measuring surface characteristics of at least a portion of an object, comprising:
providing at least one light source;
directing light from the at least one light source to generate a first interference pattern on the at least a portion of the object;
capturing at least one first image of the first interference pattern;
shifting the phase of the at least one light source to generate a second interference pattern;
capturing at least one second image of the second interference pattern;
filtering distortion from the first interference pattern and/or the second interference pattern;
extracting a wrapped phase of the at least a portion of the object based on the at least one first image and the at least one second image;
unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase;
identifying a computed depth map distance to the at least a portion of the object based on the unwrapped phase; and
fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics;
wherein the object is substantially cylindrical, substantially spherical, or substantially flat on at least one surface, and wherein said measuring surface characteristics includes determining a deviation of a surface characteristic of at least a portion of an object from an ideal surface.
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