US RE49,651 E1
Apparatus for characterizing particles and method for use in characterizing particles
David Spriggs, Malvern (GB); and Clive Catterall, Malvern (GB)
Assigned to Malvern Panalytical Limited, Malvern (GB)
Filed by Malvern Panalytical Limited, Malvern (GB)
Filed on Dec. 11, 2018, as Appl. No. 16/216,085.
Application 16/216,085 is a reissue of application No. 15/139,128, filed on Apr. 26, 2016, granted, now 9,897,525, issued on Feb. 20, 2018.
Claims priority of application No. 15166133 (EP), filed on May 1, 2015.
Int. Cl. G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01N 21/47 (2006.01); G01N 21/53 (2006.01); G01N 15/06 (2006.01)
CPC G01N 15/0211 (2013.01) [G01N 15/0227 (2013.01); G01N 15/1434 (2013.01); G01N 21/47 (2013.01); G01N 21/532 (2013.01); G01N 15/1436 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1493 (2013.01)] 12 Claims
OG exemplary drawing
 
1. A [ light diffraction ] particle characterisation apparatus comprising:
a first light source;
a second light source,
a sample cell;
a first detector , [ comprising a plurality of detector elements each corresponding with a different range of scattering angles;]
a second detector , [ different from the first detector; ] and
a processor; wherein:
the first light source is operable to illuminate a first region of a sample comprising dispersed particles within the sample cell with a first light beam along a first light beam axis so as to produce scattered light by interactions of the first light beam with the sample;
the first detector is configured to detect the scattered light;
the second light source is operable to illuminate a second region of the sample with a second light beam along a second light beam axis;
the second detector is an imaging detector, configured to image the particles along an imaging axis using the second light beam;
the first light beam axis is at an angle of at least 5 degrees to the second light beam axis; and
the processor is configured to correlate or cross-reference output from the first detector with output from the second detector to perform a light diffraction measurement to derive a particle size
[ the sample cell comprises a first wall and a second wall, and the first light beam passes through the first wall, then through the sample, then through the second wall, wherein the first and second wall of the sample cell each comprise a convex external surface through which the first light beam axis and the second light beam axis passes] .