CPC G01N 15/0211 (2013.01) [G01N 15/0227 (2013.01); G01N 15/1434 (2013.01); G01N 21/47 (2013.01); G01N 21/532 (2013.01); G01N 15/1436 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1493 (2013.01)] | 12 Claims |
1. A [ light diffraction ] particle characterisation apparatus comprising:
a first light source;
a second light source,
a sample cell;
a first detector
a second detector
a processor; wherein:
the first light source is operable to illuminate a first region of a sample comprising dispersed particles within the sample cell with a first light beam along a first light beam axis so as to produce scattered light by interactions of the first light beam with the sample;
the first detector is configured to detect the scattered light;
the second light source is operable to illuminate a second region of the sample with a second light beam along a second light beam axis;
the second detector is an imaging detector, configured to image the particles along an imaging axis using the second light beam;
the first light beam axis is at an angle of at least 5 degrees to the second light beam axis; and
[ the sample cell comprises a first wall and a second wall, and the first light beam passes through the first wall, then through the sample, then through the second wall, wherein the first and second wall of the sample cell each comprise a convex external surface through which the first light beam axis and the second light beam axis passes] .
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