US 11,755,689 B2
Methods, systems, articles of manufacture and apparatus to manage process excursions
Brian McCarson, Chandler, AZ (US); Keith Ellis, Carlow (IE); Michael McGrath, Virginia (IE); Niall Cahill, Dublin (IE); Lisa Sherin, Dublin (IE); and Daire Healy, Enfield (IE)
Assigned to Intel Corporation, Santa Clara, CA (US)
Filed by Intel Corporation, Santa Clara, CA (US)
Filed on Jun. 24, 2019, as Appl. No. 16/450,123.
Prior Publication US 2019/0340843 A1, Nov. 7, 2019
Int. Cl. G07C 3/14 (2006.01); G06F 18/24 (2023.01); G05B 13/04 (2006.01); G06N 5/022 (2023.01); G05B 13/02 (2006.01); G05B 19/418 (2006.01)
CPC G06F 18/24 (2023.01) [G05B 13/0265 (2013.01); G05B 13/04 (2013.01); G06N 5/022 (2013.01); G07C 3/146 (2013.01); G05B 19/41875 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An apparatus to identify an excursion effect in a process control system, the apparatus comprising:
digital twin comparer circuitry to determine when a product fails to satisfy a tolerance metric of a digital twin;
fingerprint manager circuitry to generate a fingerprint corresponding to a sensor pattern;
classification manager circuitry to classify the fingerprint against a knowledgebase of known process excursion fingerprints;
node interfacer circuitry to:
prevent operational disparity of the process control system by transmitting the classified fingerprint to a number of workstations of the process control system within a threshold amount of time; and
identify a threshold count of transmission confirmations of the classified fingerprint, the threshold count of transmission confirmations corresponding to the number of workstations of the process control system; and
excursion statistics calculator circuitry to invoke a corrective action for respective ones of the number of workstations, the corrective action based on a threshold count of the number of workstations that exhibit the fingerprint.