US 11,754,596 B2
Test site configuration in an automated test system
Michael O. McKenna, North Reading, MA (US); Christopher James Bruno, North Reading, MA (US); Philip Luke Campbell, North Reading, MA (US); and John Patrick Toscano, North Reading, MA (US)
Assigned to TERADYNE, INC., North Reading, MA (US)
Filed by Teradyne, Inc., North Reading, MA (US)
Filed on Oct. 22, 2020, as Appl. No. 17/77,804.
Prior Publication US 2022/0128597 A1, Apr. 28, 2022
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01)
CPC G01R 1/0458 (2013.01) [G01R 1/0466 (2013.01); G01R 31/2862 (2013.01); G01R 31/2863 (2013.01); G01R 31/2875 (2013.01); G01R 31/2877 (2013.01)] 21 Claims
OG exemplary drawing
 
1. A test system comprising:
a test socket for testing a device under test (DUT);
a lid for the test socket; and
an actuator configured to force the lid onto the test socket and to remove the lid from the test socket, the actuator comprising:
an upper arm to move the lid;
an attachment mechanism connected to the upper arm to contact the lid, the attachment mechanism being configured to allow the lid to float relative to the test socket to enable alignment between the lid and the test socket; and
a lower arm to anchor the actuator to a board containing the test socket;
wherein the actuator is configured to move the upper arm linearly towards and away from the test socket and to rotate the upper arm towards and away from the test socket; and
wherein the lid comprises a lid assembly, the lid assembly comprising:
a cap to contact the DUT;
a thermoelectric cooler (TEC) in contact with the cap;
a thermally-conductive plate in contact with the TEC; and
a stop plate in contact with the thermally-conductive plate, the stop plate to make contact with a frame of the test socket when the actuator forces the lid onto the test socket.