US 11,754,486 B2
Systems and methods for measuring properties of particles
Joon Ho Kang, Cambridge, MA (US); Selim Olcum, Cambridge, MA (US); and Scott R. Manalis, Portland, OR (US)
Assigned to Massachusetts Institute of Technology, Cambridge, MA (US)
Appl. No. 16/624,000
Filed by Massachusetts Institute of Technology, Cambridge, MA (US)
PCT Filed Jun. 18, 2018, PCT No. PCT/US2018/037995
§ 371(c)(1), (2) Date Dec. 18, 2019,
PCT Pub. No. WO2018/236708, PCT Pub. Date Dec. 27, 2018.
Claims priority of provisional application 62/521,894, filed on Jun. 19, 2017.
Prior Publication US 2021/0148806 A1, May 20, 2021
Int. Cl. G01N 15/10 (2006.01); B01L 3/00 (2006.01); G01N 33/50 (2006.01)
CPC G01N 15/1056 (2013.01) [B01L 3/502761 (2013.01); G01N 33/5011 (2013.01); B01L 2200/0652 (2013.01); B01L 2400/0436 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1043 (2013.01)] 23 Claims
OG exemplary drawing
 
1. A method for determining a property of a particle, comprising:
oscillating a suspended microchannel at a frequency within 10% of a resonant frequency of the suspended microchannel;
flowing the particle in the suspended microchannel; and
determining an acoustic scattering signal of the suspended microchannel while the particle flows through the suspended microchannel, wherein determining the acoustic scattering signal comprises determining a node deviation, wherein the node deviation comprises a difference in the resonant frequency of the suspended microchannel when the particle is at a node location of the suspended microchannel and the resonant frequency of the suspended microchannel when the particle is not in the suspended microchannel.