US 11,751,837 B2
X-ray imaging apparatus and x-ray image processing method
Frederic Hudon, Laval (CA); and Michel Archambault, Laval (CA)
Assigned to Shimadzu Corporation, Kyoto (JP)
Filed by Shimadzu Corporation, Kyoto (JP)
Filed on May 5, 2021, as Appl. No. 17/308,631.
Claims priority of application No. 2020-085596 (JP), filed on May 15, 2020.
Prior Publication US 2021/0353245 A1, Nov. 18, 2021
Int. Cl. A61B 6/00 (2006.01); A61B 90/00 (2016.01); G06T 7/246 (2017.01)
CPC A61B 6/547 (2013.01) [A61B 6/463 (2013.01); A61B 6/5241 (2013.01); A61B 90/39 (2016.02); G06T 7/246 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/20221 (2013.01)] 10 Claims
OG exemplary drawing
 
1. An X-ray imaging apparatus comprising:
an X-ray tube configured to irradiate a subject with X-rays;
an X-ray detector configured to detect the X-rays transmitted through the subject; and
an image control processor configured to generate a composite image by superimposing a plurality of X-ray images generated based on a detection signal output from the X-ray detector,
wherein the image control processor is configured to detect, in each of the plurality of X-ray images generated based on the detection signal output from the X-ray detector, both a marker for indicating a position of a predetermined target object to be indwelled in a body of the subject and a shape of a device to be placed in the body of the subject separately from the predetermined target object,
wherein the image control processor is configured to deform each of the plurality of X-ray images in such a manner that the devices in the plurality of X-ray images overlap with each other and generate the composite image by superimposing the plurality of deformed X-ray images based on the marker and the shape of the device both detected in each of the plurality of X-ray images, and
wherein the image control processor is configured to generate the composite image by superimposing the plurality of deformed X-ray images in such a manner that the devices overlap with a device reference shape that is an average shape of the device shapes detected in the plurality of X-ray images.