US 11,751,825 B2
Devices, systems, and methods for controlling acquisition parameters when carrying out a medical x-ray examination
Elizaveta Stepina, Adelsdorf (DE); Robert Brauweiler, Baiersdorf (DE); and Philip Mewes, Nuremberg (DE)
Assigned to Siemens Healthcare GmbH, Erlangen (DE)
Filed by Siemens Healthcare GmbH, Erlangen (DE)
Filed on Mar. 24, 2020, as Appl. No. 16/828,223.
Claims priority of application No. 102019204287.2 (DE), filed on Mar. 27, 2019.
Prior Publication US 2020/0305815 A1, Oct. 1, 2020
Int. Cl. A61B 6/00 (2006.01)
CPC A61B 6/467 (2013.01) [A61B 6/54 (2013.01); A61B 6/542 (2013.01)] 23 Claims
OG exemplary drawing
 
1. A medical x-ray device configured to control acquisition parameters when carrying out a medical x-ray examination, the medical x-ray device comprising:
an x-ray unit;
a detection unit;
a lever having a deflectably supported lever arm, wherein the lever arm is configured to be deflected from a rest position to a first end point by a first force provided by an operator, and wherein the lever arm is configured to be deflected to a second end point by a second force provided by the operator that is different from the first force;
a switch; and
a processor configured to:
initiate an x-ray scanning of an examination object by the x-ray unit and the detection unit upon deflection of the lever arm from the rest position,
determine a first value of at least one acquisition parameter of the medical x-ray examination based on the deflection of the lever arm from the rest position to the first end point, wherein the first value is dependent on a measure of deflection by a sensor of the deflection of the lever arm from the rest position to the first end point,
receive a control command from an actuation of the switch by a deflection of lever arm to the second end point, and
determine a second value of the at least one acquisition parameter of the medical x-ray examination using the received control command.
 
14. A medical x-ray apparatus comprising:
a medical x-ray device configured to control acquisition parameters when carrying out a medical x-ray examination, the medical x-ray device having:
an x-ray unit;
a detection unit;
a lever having a deflectably supported lever arm, wherein the lever arm is configured to be deflected from a rest position to a first end point by a first force provided by an operator, and wherein the lever arm is configured to be deflected to a second end point by a second force provided by the operator that is different from the first force;
a switch; and
a processor configured to:
initiate an x-ray scanning of an examination object by the x-ray unit and the detection unit upon deflection of the lever arm from the rest position,
determine a first value of at least one acquisition parameter of the medical x-ray examination based on the deflection of the lever arm from the rest position to the first end point, wherein the first value is dependent on a measure of deflection by a sensor of the deflection of the lever arm from the rest position to the first end point,
receive a control command from an actuation of the switch by a deflection of lever arm to the second end point, and
determine a second value of the at least one acquisition parameter of the medical x-ray examination using the received control command.
 
15. A method for controlling acquisition parameters when carrying out a medical x-ray examination, the method comprising:
providing a medical x-ray device comprising an x-ray unit, a detection unit, a lever, a switch, and a processor, wherein the lever has a deflectably supported lever arm;
deflecting the lever arm from a rest position to a first end point by a first force provided by an operator and to a second end point by a second force provided by the operator that is different from the first force;
initiating, by the processor of the medical x-ray device, an x-ray scanning of an examination object upon the deflecting of the lever arm from the rest position;
determining, by the processor, a first value of at least one acquisition parameter of the medical x-ray examination based on the deflection of the lever arm from the rest position to the first end point, wherein the first value is dependent on a measure of deflection of the deflection of the lever arm from the rest position to the first end point;
receiving, by the processor, a control command from an actuation of the switch by a deflection of the lever arm to the second end point; and
determining, by the processor, a second value of the at least one acquisition parameter of the medical x-ray examination using the received control command.