CPC A61B 5/0075 (2013.01) [A61B 2576/00 (2013.01)] | 15 Claims |
1. A method for determining sub-diffuse scattering parameters of a material, the method operable on a structured light imaging machine, comprising:
illuminating the material with structured light of a plurality of phase shifts, the structured light provided by a structured light illuminator adapted to provide structured light at a plurality of spatial frequencies;
imaging remission by the material of the structured light with a digital camera; and
determining, in an analysis module, from images captured in the step of imaging, sub-diffuse scattering parameters of the material;
wherein the step of illuminating comprises, at a spectral wavelength of the structured light, temporally varying periodic structure of the structured light to produce each of a plurality of spatial frequencies and, for each of the plurality of spatial frequencies, a plurality of spatial phase shifts;
the step of imaging comprising capturing a plurality of images including an image of the remission for each of the plurality of spatial phase shifts associated with each of the plurality of spatial frequencies; and
the step of determining comprising processing the plurality of images to deduce wavelength-specific values of the sub-diffuse scattering parameters;
the step of determining comprises:
generating demodulated images respectively associated with the plurality of spatial frequencies, each of the demodulated images being generated from the plurality of images captured for a respective one of the plurality of spatial frequencies; and
fitting a wavelength dependent model for demodulated remission to the plurality of images, the wavelength dependent model sensitive to (a) the wavelength-specific values of the sub-diffuse scattering parameters and (b) spatial frequency of the periodic structure, to intensities in the demodulated images, to ascertain the wavelength-specific values of the sub-diffuse scattering parameters.
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