US 11,750,081 B2
Control apparatus for adjusting thermal stress
Yan Zhou, Canton, MI (US); Baiming Shao, Novi, MI (US); Yingying Gui, Novi, MI (US); and Krzysztof S. Klesyk, Novi, MI (US)
Assigned to DELTA ELECTRONICS, INC., Neihu (TW)
Filed by DELTA ELECTRONICS, INC., Neihu (TW)
Filed on Nov. 17, 2020, as Appl. No. 16/950,760.
Prior Publication US 2022/0158541 A1, May 19, 2022
Int. Cl. H02M 1/32 (2007.01); H02M 7/797 (2006.01); H02M 7/5395 (2006.01)
CPC H02M 1/32 (2013.01) [H02M 7/5395 (2013.01); H02M 7/797 (2013.01); H02M 1/327 (2021.05)] 14 Claims
OG exemplary drawing
 
1. In a multi-phase voltage source inverter, an apparatus for balancing thermal stresses in semiconductor switching devices, comprising:
a monitor for monitoring temperatures of the semiconductor switching devices, the monitor selecting one of the phases and providing a temperature difference between two of the switching devices in the selected phase, the selected phase being associated with the highest temperature among the semiconductor devices monitored; and
a controller providing, based on the temperature difference, a zero-sequence component to be used for adjusting conduction times of each of the semiconductor devices.