US 11,748,001 B2
Techniques to predict or determine time-to-ready for a storage device
Joseph D. Tarango, Longmont, CO (US); and Jim S. Baca, Longmont, CO (US)
Assigned to SK hynix NAND Product Solutions Corp., San Jose, CA (US)
Filed by SK hynix NAND Product Solutions Corp., San Jose, CA (US)
Filed on Mar. 26, 2020, as Appl. No. 16/831,689.
Prior Publication US 2020/0225857 A1, Jul. 16, 2020
Int. Cl. G06F 3/00 (2006.01); G06F 3/06 (2006.01); G06N 5/04 (2023.01)
CPC G06F 3/0629 (2013.01) [G06F 3/0616 (2013.01); G06F 3/0679 (2013.01); G06N 5/04 (2013.01)] 19 Claims
OG exemplary drawing
 
1. An apparatus comprising:
a first interface to couple with a compute device;
a second interface to couple with one or more memory die; and
a controller coupled with the first and second interfaces, the controller to include circuitry to:
obtain first operating information included in a snapshot for a data storage device, the snapshot associated with a first time interval during operation of the data storage device while coupled to a computing device; and
predict, based on the first operating information, a time-to-ready (TTR) value that indicates an amount of time the data storage device will be at an operational state following a power loss recovery of the data storage device.