US 11,747,452 B2
Distance measuring device
Mitsuharu Ohki, Tokyo (JP)
Assigned to SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
Appl. No. 16/763,903
Filed by SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa (JP)
PCT Filed Oct. 17, 2018, PCT No. PCT/JP2018/038711
§ 371(c)(1), (2) Date May 13, 2020,
PCT Pub. No. WO2019/102751, PCT Pub. Date May 31, 2019.
Claims priority of application No. 2017-224451 (JP), filed on Nov. 22, 2017.
Prior Publication US 2021/0025980 A1, Jan. 28, 2021
Int. Cl. G01S 7/487 (2006.01); G01S 7/48 (2006.01); G01S 7/4863 (2020.01); G01S 17/08 (2006.01)
CPC G01S 7/487 (2013.01) [G01S 7/4808 (2013.01); G01S 7/4863 (2013.01); G01S 17/08 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A distance measuring device, comprising:
a first circuitry configured to:
acquire a histogram, wherein
the histogram indicates a frequency of reception of reflected light, and
the reflected light includes active light components that are active light emitted from a light emitting unit and reflected by a target object and ambient light components that are ambient light reflected by the target object;
execute a statistical processing operation on the histogram;
detect a distribution of the active light components in the histogram;
obtain, for each histogram of a plurality of histograms, an occurrence rate by dividing each value of the histogram by a specific value, wherein the specific value is obtained by subtracting a smallest frequency from a total number in the histogram,
obtain peaks and peak areas of occurrence rates of the plurality of histograms;
obtain an area of a region of the target object from a ratio between the peak areas; and
measure a distance to the target object as distance information based on the obtained area of the region of the target object.