US 11,747,302 B2
Method and system for detecting a material response
Witold Chalupczak, Bracknell (GB); Rafal Gartman, London (GB); and Patrick Bevington, London (GB)
Assigned to NPI Management Limited; and The University of Strathclyde
Appl. No. 17/261,336
Filed by NPL Management Limited, Middlesex (GB); and The University of Strathclyde, Scotland (GB)
PCT Filed Jul. 11, 2019, PCT No. PCT/GB2019/051953
§ 371(c)(1), (2) Date Jan. 19, 2021,
PCT Pub. No. WO2020/016557, PCT Pub. Date Jan. 23, 2020.
Claims priority of application No. 1811928 (GB), filed on Jul. 20, 2018; and application No. 1813858 (GB), filed on Aug. 24, 2018.
Prior Publication US 2021/0278371 A1, Sep. 9, 2021
Int. Cl. G01N 27/82 (2006.01)
CPC G01N 27/82 (2013.01) 10 Claims
OG exemplary drawing
 
1. A method of detecting a material response, including:
providing an oscillating primary magnetic field to cause a sample to produce a secondary magnetic field;
reducing the effect on an atomic magnetometer of components of the primary and secondary magnetic fields in a direction substantially orthogonal to a surface of the sample;
detecting the secondary magnetic field with the atomic magnetometer to detect the material response; and
wherein reducing the effect on an atomic magnetometer of components of the primary and secondary magnetic fields in a direction substantially orthogonal to a surface of a sample includes:
providing a compensatory magnetic field at the atomic magnetometer including a component substantially orthogonal to the surface of the sample.