CPC G01N 27/82 (2013.01) | 10 Claims |
1. A method of detecting a material response, including:
providing an oscillating primary magnetic field to cause a sample to produce a secondary magnetic field;
reducing the effect on an atomic magnetometer of components of the primary and secondary magnetic fields in a direction substantially orthogonal to a surface of the sample;
detecting the secondary magnetic field with the atomic magnetometer to detect the material response; and
wherein reducing the effect on an atomic magnetometer of components of the primary and secondary magnetic fields in a direction substantially orthogonal to a surface of a sample includes:
providing a compensatory magnetic field at the atomic magnetometer including a component substantially orthogonal to the surface of the sample.
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