US 11,747,190 B2
Method for calibrating an apparatus for measuring a process value of at least one substance, method for measuring a process value of at least one substance by an apparatus, and system
Steffen Mueller, Pforzheim (DE)
Assigned to Berthold Technologies GmbH & Co. KG, Bad Wildbad (DE)
Filed by Berthold Technologies GmbH & Co. KG, Bad Wildbad (DE)
Filed on Jun. 9, 2021, as Appl. No. 17/343,094.
Claims priority of application No. 20179373 (EP), filed on Jun. 10, 2020.
Prior Publication US 2021/0389168 A1, Dec. 16, 2021
Int. Cl. G01F 25/20 (2022.01); G01F 23/288 (2006.01); G01N 9/24 (2006.01)
CPC G01F 25/20 (2022.01) [G01F 23/288 (2013.01); G01N 9/24 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A method for calibrating an apparatus for measuring a process value of at least one substance, wherein the apparatus comprises a detector device that is configured to measure a detector value by capturing gamma rays that have at least partially penetrated at least the substance, and to produce the detector value based on the captured gamma rays, the method comprising:
in a case of a known process value, measuring a first detector value of a first type based only on captured gamma rays that are not scattered or are slightly scattered,
calculating a calibration assignment based on a process model, wherein the process model is based on a description of the penetration only taking into account unscattered gamma rays, and based on the first detector value of the first type, wherein the calibration assignment assigns a first detector value of the first type to each of different process values,
in a case of at least one unknown process value, measuring the first detector value of the first type and measuring a second detector value of a second type at least based on captured gamma rays that are scattered,
determining the unknown process value by using the calculated calibration assignment based on the first detector value of the first type, and
modifying the calibration assignment by assigning the second detector value of the second type to the determined process value.