US 11,733,299 B2
Test apparatus and method for synthetically testing at least one switch device for a high-voltage battery of a vehicle
Suljo Hajdarbasic, Munich (DE); Florian Pritscher, Munich (DE); Andre Ribeiro, Munich (DE); and Wladislaw Waag, Munich (DE)
Assigned to Bayerische Motoren Werke Aktiengesellschaft, Munich (DE)
Appl. No. 16/963,534
Filed by Bayerische Motoren Werke Aktiengesellschaft, Munich (DE)
PCT Filed Mar. 27, 2019, PCT No. PCT/EP2019/057756
§ 371(c)(1), (2) Date Jul. 21, 2020,
PCT Pub. No. WO2019/206552, PCT Pub. Date Oct. 31, 2019.
Claims priority of application No. 10 2018 206 337.0 (DE), filed on Apr. 25, 2018.
Prior Publication US 2021/0048477 A1, Feb. 18, 2021
Int. Cl. G01R 31/327 (2006.01); G01R 31/333 (2006.01)
CPC G01R 31/3272 (2013.01) [G01R 31/3336 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A test apparatus for simultaneously testing at least two switch devices for a high-voltage battery of a vehicle, comprising:
a voltage source for generating an electrical test voltage between a positive high-voltage path and a negative high-voltage path of the at least two switch devices;
a first connecting device and a first current source for feeding a first electrical test current into the positive high-voltage path, wherein the first connecting device, the first current source and the positive high-voltage path together form a first circuit when testing the at least two switch devices, and
a second connecting device and a second current source for feeding a second electrical test current into the negative high-voltage path, wherein the second connecting device, the second current source and the negative high-voltage path together form a second circuit when testing the at least two switch devices, wherein
the at least two switch devices are electrically connected in series, such that respective positive high-voltage paths of the at least two switch devices are part of the first circuit and respective negative high-voltage paths of the at least two switch devices are part of the second circuit,
the first current source is configured to feed the first electrical test current into the respective positive high-voltage paths of the at least two switch devices, and
the second current source is configured to feed the second electrical test current into the respective negative high-voltage paths of the at least two switch devices.