US 11,733,282 B2
Probe for non-intrusively detecting imperfections in a test object
Laurent Bianchi, Marseilles (FR); Sebastien Bernier, Pertuis (FR); John Enderby, Bristol (GB); Mark Bowes, Carmarthenshire (GB); and Dawood Parker, Whitland (GB)
Assigned to AIRBUS HELICOPTERS, Marignane (FR)
Filed by AIRBUS HELICOPTERS, Marignane (FR)
Filed on May 24, 2022, as Appl. No. 17/751,721.
Application 17/751,721 is a continuation of application No. 16/199,809, filed on Nov. 26, 2018, granted, now 11,366,150.
Claims priority of application No. 17315008 (EP), filed on Dec. 5, 2017.
Prior Publication US 2022/0291269 A1, Sep. 15, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 29/08 (2006.01); G01R 31/00 (2006.01); G01R 1/07 (2006.01); G01N 27/24 (2006.01)
CPC G01R 29/0878 (2013.01) [G01N 27/24 (2013.01); G01R 1/07 (2013.01); G01R 31/002 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials, the probe comprising a capacitive measuring apparatus comprising at least two coplanar electrodes, wherein the capacitive measuring apparatus is adapted to measure a capacitance between the at least two coplanar electrodes at a predetermined position of the probe relative to the test object; a separator adapted to maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements; and an adjustor adapted to adjust a spatial separation between the at least two coplanar electrodes.