CPC G01R 29/0878 (2013.01) [G01N 27/24 (2013.01); G01R 1/07 (2013.01); G01R 31/002 (2013.01)] | 20 Claims |
1. A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials, the probe comprising a capacitive measuring apparatus comprising at least two coplanar electrodes, wherein the capacitive measuring apparatus is adapted to measure a capacitance between the at least two coplanar electrodes at a predetermined position of the probe relative to the test object; a separator adapted to maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements; and an adjustor adapted to adjust a spatial separation between the at least two coplanar electrodes.
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