CPC B01L 3/5025 (2013.01) [B01L 3/502723 (2013.01); B01L 3/523 (2013.01); B01L 3/527 (2013.01); B01L 2200/025 (2013.01); B01L 2200/027 (2013.01); B01L 2200/141 (2013.01); B01L 2200/143 (2013.01); B01L 2300/044 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/087 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/0864 (2013.01); B01L 2300/0893 (2013.01); B01L 2400/049 (2013.01)] | 12 Claims |
1. A sample test card comprising:
a card body defining:
a first surface comprising a first edge defining a first axis;
at least one sample well defining a well opening in the first surface, the at least one sample well comprising a first sample well; and
at least one stop hole comprising a first stop hole, the first stop hole positioned proximate to the first edge,
wherein a leading edge of the first stop hole is the edge of the first stop hole closest to the first edge of the first surface, the leading edge offset from a leading edge of the first sample well in a first direction parallel to the first axis, such that the first stop hole is configured to align with a photodetector before the first sample well is aligned for optical reading in an instance in which the card body is moving relative to the photodetector in the first direction along the first axis, and
wherein the first stop hole overlaps with the first sample well relative to the first direction parallel to the first axis, such that at least a portion of the first stop hole and at least a portion of the first sample well intersect a plane extending perpendicular to the first axis.
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