US 11,729,523 B2
Method of testing image sensor using frequency domain, test system performing the same and method of manufacturing image sensor using the same
Jongbae Lee, Asan-si (KR); Kiryel Ko, Hwaseong-si (KR); and Jinmyoung An, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Aug. 30, 2021, as Appl. No. 17/460,592.
Claims priority of application No. 10-2020-0130831 (KR), filed on Oct. 12, 2020.
Prior Publication US 2022/0114755 A1, Apr. 14, 2022
Int. Cl. H04N 17/00 (2006.01); H04N 25/00 (2023.01)
CPC H04N 25/00 (2023.01) [H04N 17/002 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method of testing an image sensor, the method comprising:
capturing at least one test image using the image sensor that is a device under test (DUT);
generating a composite image based on the at least one test image;
generating a plurality of frequency data by performing frequency signal processing on the composite image; and
determining whether the image sensor is defective by analyzing the plurality of frequency data, wherein when a first conversion value among a plurality of conversion values included in first frequency data is greater than a first threshold value, determining that the image sensor has a defect, the first frequency data being included in the plurality of frequency data.