US 11,728,799 B2
Measuring pin-to-pin delays between clock routes
Daniel Weyer, Austin, TX (US); and Raghunandan Kolar Ranganathan, Round Rock, TX (US)
Assigned to Skyworks Solutions, Inc., Irvine, CA (US)
Filed by Skyworks Solutions, Inc., Irvine, CA (US)
Filed on Mar. 17, 2022, as Appl. No. 17/697,052.
Application 17/697,052 is a continuation of application No. 16/717,816, filed on Dec. 17, 2019, granted, now 11,283,437.
Prior Publication US 2022/0209760 A1, Jun. 30, 2022
Int. Cl. H03K 5/1534 (2006.01); G04F 10/00 (2006.01); H03L 7/08 (2006.01); H03K 5/00 (2006.01)
CPC H03K 5/1534 (2013.01) [G04F 10/005 (2013.01); H03K 2005/00019 (2013.01); H03L 7/08 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A delay measurement circuit for measuring delays between signal routes of an integrated circuit, the delay measurement circuit comprising:
a first skew circuit disposed proximate to a first bonding pad configured to receive a first clock signal having a first frequency;
a second skew circuit disposed proximate to a second bonding pad configured to receive a second clock signal having a second frequency, the second frequency being integrally related to the first frequency, the first skew circuit and the second skew circuit each having a first mode of operation as zero-delay-return path and a second mode of operation as a synchronized pass path;
a first pair of conductive traces coupled to the first skew circuit;
a second pair of conductive traces coupled to the second skew circuit;
a time-to-digital converter circuit; and
a switch circuit configured to selectively couple the time-to-digital converter circuit to the first skew circuit via the first pair of conductive traces and the second skew circuit via the second pair of conductive traces.