US 11,728,001 B2
Apparatuses for characterizing system channels and associated methods and systems
Markus H. Geiger, Boise, ID (US); Anthony D. Newton, Boise, ID (US); Ron A. Hughes, Kuna, ID (US); and Eric J. Stave, Meridian, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Nov. 16, 2020, as Appl. No. 17/99,694.
Prior Publication US 2022/0157396 A1, May 19, 2022
Int. Cl. G01R 31/28 (2006.01); G11C 29/02 (2006.01); G01R 31/317 (2006.01); G01R 31/30 (2006.01); G11C 29/04 (2006.01)
CPC G11C 29/025 (2013.01) [G01R 31/2818 (2013.01); G01R 31/2863 (2013.01); G01R 31/30 (2013.01); G01R 31/317 (2013.01); G11C 2029/0407 (2013.01)] 18 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a connector configured to connect to a first socket of a motherboard, the first socket configured to receive a semiconductor device;
an interface comprising a plurality of electrical contacts configured to receive one or more test signals from a tester coupled to the apparatus; and
circuitry configured to route the one or more test signals from the interface to the connector,
wherein the apparatus is configured to, if connected to the first socket through the connector, transmit the one or more test signals to a memory device connected to a second socket of the motherboard via a system channel of the motherboard coupling the first socket with the second socket.