US 11,726,111 B2
Test device
Changhyun Song, Busan (KR); and Jaehwan Jeong, Busan (KR)
Assigned to LEENO INDUSTRIAL INC.
Filed by LEENO INDUSTRIAL INC., Busan (KR)
Filed on Mar. 28, 2022, as Appl. No. 17/705,639.
Application 17/705,639 is a division of application No. 16/850,116, filed on Apr. 16, 2020, granted, now 11,391,757.
Application 16/850,116 is a continuation of application No. PCT/KR2018/014396, filed on Nov. 22, 2018.
Claims priority of application No. 10-2017-0162775 (KR), filed on Nov. 30, 2017.
Prior Publication US 2022/0214377 A1, Jul. 7, 2022
Int. Cl. G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 1/18 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01); G01R 31/70 (2020.01)
CPC G01R 1/06772 (2013.01) [G01R 1/045 (2013.01); G01R 31/26 (2013.01); G01R 31/2886 (2013.01); G01R 31/70 (2020.01)] 4 Claims
OG exemplary drawing
 
1. A test device for testing electric characteristics of an object, the test device comprising:
a conductive block including at least one signal probe hole for accommodating at least one signal probe therein without contacting an inner wall of the signal probe hole, and at least one ground probe hole for accommodating at least one ground probe therein while allowing contacting an inner wall of the ground probe hole;
an upper supporting member mounted on an upper surface of the conductive block, the upper supporting member including at least one signal probe hole at locations corresponding to the at least one signal probe hole of the conductive block, the signal probe hole of the upper supporting member being configured to support an upper end of the signal probe introduced thereto through the signal probe hole of the conductive block;
a lower supporting member mounted under a lower surface of the conductive block, the lower supporting member including at least one signal probe hole at locations corresponding to the at least one signal probe hole of the conductive block, the signal probe hole of the lower supporting member being configured to support a lower end of the signal probe introduced thereto through the signal probe hole of the conductive block;
a coaxial cable including a core wire configured to be in electric contact with the lower end of the signal probe, and
a cable supporter which includes a cable supporting block, the cable supporting block including a cable accommodating hole for accommodating the coaxial cable therein to provide the electric contact with the lower end of the signal probe,
wherein the cable supporting block comprises a cable supporting recess recessed from a surface opposite to an area where the cable supporting block is coupled to the conductive block,
wherein the coaxial cable is secured in place with adhesive filled in the cable supporting recess and hardened.